This book represents the compilation of papers presented at the second atomic force microscopy scanning tunneling microscopy afm stm symposium held june 7 to 9 1994 in natick massachusetts at natick research development and engineering center now part ofu s army soldier systems command. This video is about scanning tunneling microscopy stm and atomic force microscopy afm which gives excellent resolution and magnification. Atomic force microscopy afm or scanning force microscopy sfm is a very high resolution type of scanning probe microscopy spm with demonstrated resolution on the order of fractions of a nanometer more than 1000 times better than the optical diffraction limit. A scanning tunneling microscope stm is an instrument for imaging surfaces at the atomic levelits development in 1981 earned its inventors gerd binnig and heinrich rohrer at ibm zurich the nobel prize in physics in 1986 for an stm good resolution is considered to be 01 nm lateral resolution and 001 nm 10 pm depth resolution with this resolution individual atoms within materials . Proceedings of the second us army soldier systems command natick research development and engineering center atomic force microscopy scanning tunneling microscopy afm stm symposium held june 7 9 1994 in natick massachusetts title page verso
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